Patent attributes
This invention relates to a technique for analyzing a sample. A sample analyzer (1) provided by the invention includes: a voltage applier (12) for applying a voltage to a reaction field which includes a sample; a response measurer (13) for measurement of a response to the voltage applied to the reaction field; a selector (11) for selecting a first voltage application state for measurement of a first response for use in calculation necessary for analyzing the sample or a second voltage application state for measurement of a second response for use in determining whether or not the reaction field has been supplied with a target amount of the sample; an arithmetic operator (17) for calculation necessary for analyzing the sample based on the first response; a determiner (17) for determination, based on the second response, on whether or not the reaction field has been supplied with the target amount of sample; and a controller (15) which makes the selector select the second voltage application state after making the selector select the first voltage application state.
