US Patent 7535561 Defect inspecting apparatus
Patent 7535561 was granted and assigned to Hitachi on May, 2009 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
March 14, 2007
Date of Patent
May 19, 2009
Patent Application Number
11717651
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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