Patent attributes
An embedded memory and methods thereof are provided. The example embedded memory may include a first memory block configured to output data, selected by a first column select signal, on a first scan output line if the first memory block is determined to be non-defective and a second memory block configured to output data, selected by a second column select signal on a second scan output line if the first memory block is determined to be non-defective, the second memory block further configured to output data, selected by the first column select signal, on the first scan output line if the first memory block is determined to be defective. A first example method may include performing a memory scan on a plurality of cell arrays, determining whether at least one of a plurality of cell arrays is defective based on the results of the memory scan, receiving data to be stored in a first cell array of the plurality of cell arrays, storing the received data in the first cell array if the determining determines the first cell array not to be defective and storing the received data in a second cell array, if the determining determines the first cell array to be defective. A second example method may include retrieving data from an embedded memory, including receiving data on a first scan output line from a first cell array, included among a plurality of cell arrays, if the first cell array is not defective and receiving data on the first scan line from a second cell array if the first cell array is defective.
