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US Patent 7497613 Probe with embedded heater for nanoscale analysis

Patent 7497613 was granted and assigned to Anasys Instruments on March, 2009 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
Current Assignee
Anasys Instruments
Anasys Instruments
Date Filed
April 18, 2006
Date of Patent
March 3, 2009
Patent Application Number
11405772
Patent Citations Received
‌
US Patent RE49997 Metrological scanning probe microscope
0
‌
US Patent 12016778 Implantable joint having heating system
0
Patent Inventor Names
Mike Reading
0
William P. King
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7497613
Patent Primary Examiner
‌
Gail Verbitsky

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