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US Patent 7494545 Epitaxial deposition process and apparatus

Patent 7494545 was granted and assigned to Applied Materials on February, 2009 by the United States Patent and Trademark Office.

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Patent
Patent

Patent attributes

Current Assignee
Applied Materials
Applied Materials
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7494545
Date of Patent
February 24, 2009
Patent Application Number
11346804
Date Filed
February 3, 2006
Patent Citations Received
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3
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US Patent 11915950 Multi-zone semiconductor substrate supports
4
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US Patent 12009228 Low temperature chuck for plasma processing systems
5
Patent Primary Examiner
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Felisa C. Hiteshew
Patent abstract

An epitaxial deposition process including a dry etch process, followed by an epitaxial deposition process is disclosed. The dry etch process involves placing a substrate to be cleaned into a processing chamber to remove surface oxides. A gas mixture is introduced into a plasma cavity, and the gas mixture is energized to form a plasma of reactive gas in the plasma cavity. The reactive gas enters into the processing chamber and reacts with the substrate, forming a thin film. The substrate is heated to vaporize the thin film and expose an epitaxy surface. The epitaxy surface is substantially free of oxides. Epitaxial deposition is then used to form an epitaxial layer on the epitaxy surface.

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