Patent 7443894 was granted and assigned to Finesse Solutions on October, 2008 by the United States Patent and Trademark Office.
A method for compensating for changes in output power or wavelength of an optical source with temperature. Many optical sources have power and/or wavelength variations with temperature which can be compensated by open- or closed-loop methods if a method of accurately measuring the optical source temperature is available. The voltage across a semiconductor junction varies with temperature. Measuring the optical source power or wavelength variation with temperature and tracking the voltage across the semiconductor junction provides a means for compensating an instrument for temperature induced optical output power or wavelength variations. An important field of application is optical density or turbidity measurements in cellular media.