US Patent 7436992 Methods and apparatus for testing a component
All edits
Edits on 15 Sep, 2023
Golden AI
Edits made to:
Article (+412 characters)
Article
Patent abstract
A method for inspecting a component. The method includes generating a scan plan of a component to be inspected, coupling a side-mount probe to an eddy current inspection system, inducing an eddy current into the component, measuring the eddy current in the component to generate a plurality of scan data, and analyzing the scan data to generate at least one image of the component being inspected.
Edits on 25 May, 2023
Golden AI
Edits made to:
Infobox (+1/-1 properties)
US Patent 07436992 Methods and apparatus for testing a component US Patent 7436992 Methods and apparatus for testing a component
Infobox
Patent Number
0743699200
Patent Number
743699200
Edits on 24 May, 2023
Golden AI
Edits made to:
Infobox (-1 properties)
Infobox
Official Website
Edits on 27 Apr, 2023
Golden AI
Infobox
Is a
Patent Jurisdiction
Patent Number
074369920
Date of Patent
October 14, 2008
0Patent Application Number
109091980
Date Filed
July 30, 2004
0Official Website
Patent Primary Examiner
Edits on 28 Sep, 2022
Golden AI
Infobox
Is a
Patent Jurisdiction
Patent Number
074369920
Date of Patent
October 14, 2008
0Patent Application Number
109091980
Date Filed
July 30, 2004
0Official Website
Patent Primary Examiner
Edits on 14 Jun, 2022
Golden AI
Edits made to:
Infobox (+1 properties)
Infobox
Website URL
Edits on 1 Dec, 2021
Golden AI
Edits made to:
Infobox (+7 properties)
US Patent 07436992 Methods and apparatus for testing a component
Infobox
Is a
Patent jurisdiction
Patent number
07436992
Date of patent
October 14, 2008
Patent application number
10909198
Date Filed
July 30, 2004
Patent primary examiner
Find more entities like US Patent 7436992 Methods and apparatus for testing a component
Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
By using this site, you agree to our Terms of Service.