US Patent 7428783 Testing system for flatness and parallelism
Is a
Date Filed
December 22, 2006
1
Date of Patent
September 30, 2008
1
Patent Application Number
11615896
1
Patent Inventor Names
Zhi Cheng
1
Lei Li
1
Ping Chen
1
Xue-Liang Zhai
1
Ai-Ge Sun
1
Chang-Fa Sun
1
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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