US Patent 7428181 Semiconductor device with self refresh test mode

Patent 7428181 was granted and assigned to Micron Technology on September, 2008 by the United States Patent and Trademark Office.

Overview Structured Data Issues Contributors Activity

Is a

Patent

Patent attributes

Current Assignee

Micron Technology

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

74281810

Patent Inventor Names

Terry R. Lee0

Date of Patent

September 23, 2008

Patent Application Number

111812980

Date Filed

July 14, 2005

Patent Primary Examiner

‌

J. H. Hur

Patent abstract

A semiconductor device includes a memory array that has dynamic memory cells. In a self refresh test mode, a self refresh test mode controller monitors and/or controls various blocks and internal signals in the semiconductor device. The self refresh test mode controller may communicate with a remote testing device through various conductors including one or more DQ lines and/or one or more address lines.