US Patent 7423264 Atomic force microscope
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Patent abstract
In one embodiment, an atomic force microscope comprises a frame, a beam coupled to the frame at a first end and a second end, a probe mounted to the beam, means for inducing relative motion between the beam and an underlying surface, and means for detecting a characteristic of the beam.
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US Patent 07423264 Atomic force microscope US Patent 7423264 Atomic force microscope
Infobox
Patent Number
0742326400
Patent Number
742326400
Edits on 26 Apr, 2023
Golden AI
Infobox
Is a
Patent Jurisdiction
Patent Number
074232640
Date of Patent
September 9, 2008
0Patent Application Number
115183200
Date Filed
September 8, 2006
0Official Website
Patent Primary Examiner
Edits on 28 Sep, 2022
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Infobox
Is a
Patent Jurisdiction
Patent Number
074232640
Date of Patent
September 9, 2008
0Patent Application Number
115183200
Date Filed
September 8, 2006
0Official Website
Patent Primary Examiner
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US Patent 07423264 Atomic force microscope
Infobox
Is a
Patent jurisdiction
Patent number
07423264
Date of patent
September 9, 2008
Patent application number
11518320
Date Filed
September 8, 2006
Patent primary examiner
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