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US Patent 7422365 Thermal imaging system and method

Patent 7422365 was granted and assigned to Land Instruments International on September, 2008 by the United States Patent and Trademark Office.

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Patent
Patent

Patent attributes

Current Assignee
Land Instruments International
Land Instruments International
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7422365
Patent Inventor Names
Andrew Mellor0
Gary Roy Chamberlain0
Ian Hamilton Ridley0
Date of Patent
September 9, 2008
Patent Application Number
10554140
Date Filed
April 23, 2004
Patent Citations Received
0
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US Patent 11692871 System and method for disposable imaging system
0
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US Patent 11965735 Thickness measurement method, thickness measurement device, defect detection method, and defect detection device
0
Patent Primary Examiner
‌
Gail Verbitsky
Patent abstract

A thermal imaging system and method for quantitative thermal mapping of a scene. The system comprises a thermal imaging device, a heat source of known temperature and emissivity located within the scene viewed by the thermal imaging device and a processor adapted to generate a calibrated temperature map of the scene from the data supplied by the thermal imaging device, based on the known temperature of the heat source. This enables accurate temperature measurements to be made using inexpensive uncooled Focal Plane Array detectors.

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