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US Patent 7400389 Method and apparatus for testing image sensors

Patent 7400389 was granted and assigned to Micron Technology on July, 2008 by the United States Patent and Trademark Office.

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Current Assignee
Micron Technology
Micron Technology
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7400389
Date of Patent
July 15, 2008
Patent Application Number
11528279
Date Filed
September 28, 2006
Patent Primary Examiner
‌
Kara E Geisel
Patent abstract

Methods and apparatuses for testing image sensors are disclosed. Desirable apparatuses of the present invention include image sensor testing devices comprising a digital light projection system capable of projecting static or dynamic images onto an image sensing device under test and an image sensor signal detection means for analyzing the output of said image sensing device under test. The digital light projection system comprises a light source, collimating optics, a digital micromirror device, and focusing optics. Other desirable methods and apparatuses of the present invention include image sensor testing devices employing a digital light projection system capable of simultaneously testing a plurality of image sensors. According to the present invention, the light source is calibrated and converted to a desired test image by the digital micromirror device. The test image is then focused onto an image sensor, the output of which is read by a detector and correlated with the input digital test image.

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