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US Patent 7395722 Mechanical property measurement of thin films by micro plane-strain compression

Patent 7395722 was granted and assigned to E.I. Du Pont De Nemours And Company on July, 2008 by the United States Patent and Trademark Office.

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Patent abstract

This invention is directed to the measurement of stress-strain relationships in thin films using substantially flat, parallel test surfaces with minimal width. This invention is further directed to the measurement of stress-strain relationships in thin films at controlled temperatures and at high strain rates above 100% per second.

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