Patent 7379238 was granted and assigned to Leica Microsystems on May, 2008 by the United States Patent and Trademark Office.
The invention relates to a reflected-light microscope comprising a light source for generating an illumination light beam, which can be directed through a lens along an illumination beam path onto a sample. Said microscope is provided with imaging optics, which generate a plane that optically corresponds to the pupil plane. At least one attenuation element, which acts in an essentially uniform manner over the entire cross-section of the illumination light beam, can be introduced into the illumination beam path on the optically corresponding plane.