US Patent 7369236 Defect detection through image comparison using relative measures
Patent 7369236 was granted and assigned to Negevtech on May, 2008 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
October 31, 2006
1
Date of Patent
May 6, 2008
1
Patent Application Number
11590650
1
Patent Inventor Names
Erez Sali
1
Oren Cohen
1
Patent Jurisdiction
Patent Number
Patent Primary Examiner
Industry
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