US Patent 7362448 Characterizing residue on a sample
Patent 7362448 was granted and assigned to Nanometrics on April, 2008 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
September 8, 2004
Date of Patent
April 22, 2008
Patent Application Number
10937248
Patent Inventor Names
Sangbong Lee
0
Chandra Saravanan
0
Jiangtao Hu
0
Zhuan Liu
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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