US Patent 7352901 Contour inspection method and apparatus

Patent 7352901 was granted and assigned to Omron on April, 2008 by the United States Patent and Trademark Office.

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Is a

Patent

Patent attributes

Current Assignee

Omron

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

73529010

Patent Inventor Names

Shiro Fujieda0

Date of Patent

April 1, 2008

Patent Application Number

099745390

Date Filed

October 9, 2001

Patent Primary Examiner

‌

Brian Le

Patent abstract

Defects in the contour of a target object is detected by obtaining an digital variable-density image of the contour and edges are extracted from the image of the contour so as to sequentially represent the contour. Their directions are measured and the direction of each edge is compared with those of other edges selected according to their distances from the edge under consideration. The differential is indicative of the presence or absence of an indentation or a protrusion in the contour, representing a defect.