US Patent 7352638 Method and apparatus for testing a memory device

Patent 7352638 was granted and assigned to Spansion on April, 2008 by the United States Patent and Trademark Office.

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Is a

Patent

Patent attributes

Current Assignee

Spansion

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

73526380

Patent Inventor Names

Katsutoshi Suitou0

Yoshichika Nakaya0

Date of Patent

April 1, 2008

Patent Application Number

113623180

Date Filed

February 23, 2006

Patent Primary Examiner

‌

Connie C Yoha

Patent abstract

The extension sector enable signal RS_SEL is a test target control signal for switching a test target between ordinary sectors and redundant sectors. During the test period of redundant sectors, if the defective redundant sector signal RSECF is at a HIGH level (that is, the selected redundant sector is a defective sector), the compulsory signal FMATCH is brought to a HIGH level. The match signal MATCH is forcedly brought to a HIGH level (S22) in compliance with the compulsory signal FMATCH which is at a HIGH level (S21:T). And, verification (S2a) is skipped for the defective sectors, whereby the address signal for identifying the ordinary memory blocks may be utilized for identification of redundant memory blocks.