Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Philippe Cluzel0
Sebastien Harlepp0
Date of Patent
February 12, 2008
0Patent Application Number
110080020
Date Filed
December 9, 2004
0Patent Primary Examiner
Patent abstract
Techniques are provided for illuminating a sample by using total internal reflection (TIR) from a diffraction limited focused annular illumination beam. The illumination forms an affected region and an overlapping confocal region that may have dimensions the below 1 μm. An adjustable diffractive optical element, for example, may create a second order Bessel profile laser beam that is focused on a sample using a high-numerical aperture objective under TIR. An evanescent field excites fluorescent biological material in the confocal region, and fluorescence from the material is analyzed in fluorescence correlation spectroscopy system.
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