US Patent 7328620 Methods and system for ultrasound inspection

An ultrasound inspection system is provided. The ultrasound inspection system includes a pulse echo transducer and a processor that is operationally coupled to the transducer. The system facilitates reducing noise in an echo received from a near surface inspection area of a component. To facilitate reducing noise the processor is programmed to extract an A-scan data set from a B-scan image of the component. The processor is also programmed to locate a half-max point of a front surface echo in the A-scan data set. The processor is also programmed to locate the front surface of the component using a first zero crossing in a derivative of the A-scan data set.