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US Patent 7323692 Flat-panel detector with avalanche gain

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Patent
Patent
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Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
73236920
Patent Inventor Names
John A. Rowlands0
Wei Zhao0
Date of Patent
January 29, 2008
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Patent Application Number
112016580
Date Filed
August 10, 2005
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Patent Citations Received
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US Patent 12064291 Tomosynthesis-guided biopsy in prone
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...
Patent Primary Examiner
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David Porta
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Patent abstract

The present invention is an indirect AMFPI wherein a phosphor such as a structured cesium iodide (CsI) is used to convert x-ray energy to optical photons or a charge, which is then detected by a two-dimensional array of either thin-film transistors (TFTs) such as an amorphous a-Se TFTs or a photodiode array. A scanning control circuit generates pulses to turn on the TFTs one row at a time, and thus the charge in the individual arrays is transferred from the TFT to one or more external charge-sensitive amplifiers. The charge-sensitive amplifiers are shared by all the pixels in the same column. The two-dimensional array can be read in real time.

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