US Patent 7321118 Scanning transmission ion microscope
Patent 7321118 was granted and assigned to ALIS Corporation on January, 2008 by the United States Patent and Trademark Office.
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Patent Inventor Names
Billy W. Ward0
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Patent abstract
Scanning Transmission Ion Microscope. The microscope includes a bright helium ion source to generate an ion beam and a focusing electrostatic optical column to focus the ion beam. A translation stage supports a sample to receive the focused ion beam and a detector responds to ions transmitted through the sample to generate a signal from which properties of the sample may be displayed.
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US Patent 07321118 Scanning transmission ion microscope US Patent 7321118 Scanning transmission ion microscope
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Patent Number
073211180
Patent Number
73211180
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Is a
Current Assignee
Patent Jurisdiction
Patent Number
073211180
Date of Patent
January 22, 2008
0Patent Application Number
111471020
Date Filed
June 7, 2005
0Official Website
Patent Primary Examiner
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US Patent 07321118 Scanning transmission ion microscope
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
07321118
Date of patent
January 22, 2008
Patent application number
11147102
Date Filed
June 7, 2005
Patent primary examiner
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