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US Patent 7318285 Surface profile measuring instrument

Patent 7318285 was granted and assigned to Mitutoyo on January, 2008 by the United States Patent and Trademark Office.

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Current Assignee
Mitutoyo
Mitutoyo
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7318285
Date of Patent
January 15, 2008
Patent Application Number
11469076
Date Filed
August 31, 2006
Patent Primary Examiner
‌
Christopher W Fulton
Patent abstract

Provided are a measuring section (210) including a vibrating contact-type probe having a measuring force detection circuit (219) which detects a measuring force acting to the contact portion (212); a moving unit (a three-dimensional drive mechanism (300), a vertical movement drive mechanism (220)) that moves the measuring section (210) relative to a workpiece surface (S); and a drive control unit (400) that controls the moving unit based on the magnitude of the measuring force output from the measuring force detection circuit (219). The drive control unit (400) includes: a scanning-measurement control section (410) that moves for scanning the contact portion along the workpiece surface (S) with the measuring force maintained at the designated scanning measuring force; and a touching-measurement control section (420) that conducts touching-measurements on the workpiece surface (S) in a repeated manner, in the measurements the contact portion (212) being adapted to intermittently contact the workpiece surface (S) at a touch detecting measuring force.

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