Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Bart Buijsse0
Robert Frans Maria Hendriks0
Date of Patent
January 8, 2008
Patent Application Number
11268975
Date Filed
November 8, 2005
Patent Primary Examiner
Patent abstract
The invention describes a method of determining the position of fluorescent markers in a sample (4), with a high spatial resolution. To this end, the sample (4) is illuminated with an exciting light beam (11), while the sample (4) is simultaneously scanned by a particle beam (3). During scanning, markers will be impinged upon by the particle beam (3) and will be damaged, in such a manner that the marker impinged upon will no longer emit fluorescence radiation. This leads to a reduction of the flux of fluorescence radiation. This reduction is detected. Seeing as the position of the particle beam (3) w.r.t. the sample is known at the moment that the marker is damaged, the position of the marker in the sample is, accordingly, also known.
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