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US Patent 7316931 Mass defect labeling for the determination of oligomer sequences

Patent 7316931 was granted and assigned to Target Discovery on January, 2008 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Current Assignee
Target Discovery
Target Discovery
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
73169310
Patent Inventor Names
Luke V. Schneider0
Robert Petesch0
Michael P. Hall0
Date of Patent
January 8, 2008
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Patent Application Number
109130200
Date Filed
August 6, 2004
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Patent Primary Examiner
‌
Yelena G. Gakh
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Patent abstract

Mass tagging methods are provided that lead to mass spectrometer detection sensitivities and molecular discriminations that are improved over other methods. In particular the methods are useful for discriminating tagged molecules and fragments of molecules from chemical noise in the mass spectrum. These mass tagging methods are useful for oligomer sequencing, determining the relative abundances of molecules from different samples, and identifying individual molecules or chemical processing steps in combinatorial chemical libraries. The methods provided are useful for the simultaneous analysis of multiple molecules and reaction mixtures by mass spectrometric methods.

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