US Patent 7313971 Material Testing Machine
Patent 7313971 was granted and assigned to Shimadzu Corp. on January, 2008 by the United States Patent and Trademark Office.
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A material testing machine includes a load mechanism for applying a load to a test piece, and a plurality of detectors for detecting physical values associated with the applied load. An A/D converter receives the output measurement data of each of the detected physical values, and digitalizes the received output data. The A/D converter has multiple channels, and can select use/nonuse of each of the multiple channels based on an external selection signal. Since the detecting rate and/or the detecting accuracy are inversely proportional to the number of multiple channels in use at one time, the machine enables a user to prioritize between the number of channels in use, the detecting rate, and the detecting accuracy.
US Patent 07313971 Material Testing Machine US Patent 7313971 Material Testing Machine
US Patent 07313971 Material Testing Machine
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