Patent attributes
A level shifter circuit includes first and second reference potential supply lines; first and second output potential supply circuits each connected between the first and second reference potential supply lines; first and second input lines; first and second output lines; and a stress test circuit which functions to, during normal operation, when the first input signal and the second input signal are input to the first input line and the second input line, output the first output signal and the second output signal having respectively different potentials for the first output line and the second output line, and during the stress test, when the first input signal and the second input signal are input to the first input line and the second input line, output signals having identical potentials from the first output line and the second output line.
