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US Patent 7298196 Level shifter circuit with stress test function

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Patent
Patent
1

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
1
Patent Number
72981961
Patent Inventor Names
Toshio Teraishi1
Date of Patent
November 20, 2007
1
Patent Application Number
116370841
Date Filed
December 12, 2006
1
Patent Primary Examiner
‌
Quan Tra
1
Patent abstract

A level shifter circuit includes first and second reference potential supply lines; first and second output potential supply circuits each connected between the first and second reference potential supply lines; first and second input lines; first and second output lines; and a stress test circuit which functions to, during normal operation, when the first input signal and the second input signal are input to the first input line and the second input line, output the first output signal and the second output signal having respectively different potentials for the first output line and the second output line, and during the stress test, when the first input signal and the second input signal are input to the first input line and the second input line, output signals having identical potentials from the first output line and the second output line.

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