US Patent 7277307 Column defect detection in a content addressable memory

A content addressable memory (CAM) device. For one embodiment, the CAM device includes a CAM array having a plurality of columns of CAM cells, a plurality of storage elements, each for storing a column pass/fail signal indicating whether a corresponding column of CAM cells is designated as good or as bad, and a test circuit having an output coupled to the storage elements, and configured to generate the column pass/fail signals during a column test sequence.