US Patent 7263449 Method for determining poor performing cells
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Patent Inventor Names
Gary Freitag0
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Patent abstract
A means for determining long-term discharge performance, particularly in a lithium/silver vanadium oxide cell, by analyzing and characterizing the initial pulse voltage waveform, is described. The relationship between the initial P1 (Pmin) voltage drop and the extent of that initial voltage drop with Plast (the final voltage under load) is a reliable indication of long-term discharge performance.
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US Patent 07263449 Method for determining poor performing cells US Patent 7263449 Method for determining poor performing cells
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Patent Number
072634490
Patent Number
72634490
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Patent Jurisdiction
Patent Number
072634490
Date of Patent
August 28, 2007
0Patent Application Number
110159910
Date Filed
December 17, 2004
0Official Website
Patent Primary Examiner
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US Patent 07263449 Method for determining poor performing cells
Infobox
Is a
Patent jurisdiction
Patent number
07263449
Date of patent
August 28, 2007
Patent application number
11015991
Date Filed
December 17, 2004
Patent primary examiner
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