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US Patent 7249992 Method, apparatus and system for use in processing wafers

Patent 7249992 was granted and assigned to Strasbaugh on July, 2007 by the United States Patent and Trademark Office.

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Patent abstractTimelineTable: Further ResourcesReferences
Is a
Patent
Patent
1

Patent attributes

Current Assignee
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Strasbaugh
1
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
1
Patent Number
72499921
Patent Inventor Names
Tom Walsh1
William J. Kalenian1
Date of Patent
July 31, 2007
1
Patent Application Number
111739921
Date Filed
July 1, 2005
1
Patent Citations Received
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US Patent 11754622 Thermal control system for an automated test system
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US Patent 11754596 Test site configuration in an automated test system
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US Patent 11782404 Substrate processing systems, apparatus, and methods with substrate carrier and purge chamber environmental controls
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US Patent 12007411 Test socket having an automated lid
2
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US Patent 11953519 Modular automated test system
3
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US Patent 11867749 Vision system for an automated test system
4
Patent Primary Examiner
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Jacob K. Ackun Jr.
1
Patent abstract

The present embodiment provides for methods and systems for use in processing objects such as wafers, including polishing and/or grinding wafers. Some embodiments provide systems that include a front-end module and a processing module. The front end module couples with a storage device that stores objects for processing. The front-end module can comprise a single robot, a transfer station, and a plurality of end effectors. The processing module is coupled with the front-end module such that the single robot delivers objects from the storage device to the processing module. The processing module comprising a rotating table, and a spindle with a carrier configured to retrieve the delivered object and process the object on the rotating table.

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