A test apparatus for testing an electronic device, includes a test module for sending and/or receiving a test signal to and/or from the electronic device, a test head including a plurality of Test Head (TH) slots for detachably holding the test module, a diagnosis module for performing diagnosis of the test module, and a coupling device including a plurality of Performance Board (PB) slots being electrically coupled to the TH slots respectively for detachably holding the diagnosis module. The diagnosis module held in one of the PB slots diagnoses the test module held in one of the TH slots being electrically coupled to one of the PB slots.