US Patent 7167035 Delay circuitry and method therefor

Patent 7167035 was granted and assigned to Freescale Semiconductor on January, 2007 by the United States Patent and Trademark Office.

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Is a

Patent

Patent attributes

Current Assignee

Freescale Semiconductor

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

71670350

Patent Inventor Names

Lipeng Cao0

Date of Patent

January 23, 2007

Patent Application Number

110630700

Date Filed

February 22, 2005

Patent Primary Examiner

‌

Timothy P. Callahan

Patent abstract

One use for delay adjustment circuit (32), coarse-grain delay offset circuit (34), and fine-grain delay synthesis circuit (36) may be as part of a delay replication circuit (30) used to replicate the frequency versus voltage behavior of an integrated circuit (29). Also, a circuit (30) and method for determining optimal power and frequency metrics of integrated circuit (29) is also described. In addition, a method for determining programmable coefficients to replicate frequency and supply voltage correlation is described.