Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Hyung Sun You0
Sue Jin Cho0
Jang Hee Lee0
Date of Patent
January 23, 2007
0Patent Application Number
109386440
Date Filed
September 13, 2004
0Patent Citations Received
Patent Primary Examiner
Patent abstract
An apparatus and method to inspect a display panel that can correctly detect a defect of the display panel itself. In the method of inspecting the display panel, a first image is captured from the display panel in a state in which no pattern is applied to the display panel. Light is then irradiated on the display panel in a state in which a pattern is applied to the display panel, and a second image is captured from the display panel. The first image can be compared with the second image, and a determination can be made as to whether or not a defect of the display panel is present.
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