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US Patent 7153696 Method for measuring substance and testing piece

Patent 7153696 was granted and assigned to ARKRAY on December, 2006 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Current Assignee
ARKRAY
ARKRAY
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
71536960
Patent Inventor Names
Takao Fukuoka0
Atsuko Katayama0
Kenji Yamamoto0
Satoshi Yonehara0
Date of Patent
December 26, 2006
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Patent Application Number
103846050
Date Filed
March 11, 2003
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Patent Primary Examiner
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Monique T. Cole
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Patent abstract

A method of measuring an analyte, comprising a step of measuring a detectable substance by using a reaction system including a formation reaction of the detectable substance based on a chemical reaction of the analyte contained in a sample, wherein a layered inorganic compound is caused to exist in the reaction system including the formation reaction of the detectable substance, whereby high-sensitivity measurement is made possible, the detectable substance can be stabilized to improve accuracy of the measurement, a rate of a chemical reaction is increased to enable quick measurement, and high-sensitivity measurement is made possible even in a reaction system which forms an insoluble substance. Also, it can be provided an analytical testing piece for measuring an analyte, by measuring a detectable substance by using a reaction system including a formation reaction of the detectable substance based on a chemical reaction of the analyte contained in a sample, wherein the testing piece comprises at least one test portion having a detection portion for detecting the detectable substance and contains a layered inorganic compound at least in the test portion, whereby diffusion and elution of a dyestuff or the like is prevented, more sensitive and accurate simple analysis is made possible, and easy handling is possible.

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