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Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Yoshihiro Takata1
Tadashi Arii1
Date of Patent
November 28, 2006
Patent Application Number
10919477
Date Filed
August 17, 2004
Patent Primary Examiner
Patent abstract
An evolved gas analysis system contains a first measurement step of heating a first sample containing measurement target material and non-measurement target material at a predetermined temperature programming rate and detecting the amount of gas evolved from the first sample; a second measurement step of heating a second sample achieved by excluding the measurement target material from the first sample at the same temperature increasing rate as the first measurement step, and detecting the amount of gas evolved from the second sample; and a correcting step of calculating the amount of gas evolved from the measurement target material on the basis of the detected data of the respective steps.
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