US Patent 7131042 Semiconductor device and method for testing the same

Patent 7131042 was granted and assigned to Samsung on October, 2006 by the United States Patent and Trademark Office.

Overview Structured Data Issues Contributors Activity

Is a

Patent

Patent attributes

Current Assignee

Samsung

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

71310420

Patent Inventor Names

Jung-Hwan Choi0

Date of Patent

October 31, 2006

Patent Application Number

104215330

Date Filed

April 21, 2003

Patent Primary Examiner

‌

James C. Kerveros

Patent abstract

Test board configurations and test method for semiconductor devices with simultaneous bi-directional (SBD) data ports are disclosed. The devices have two SBD data ports with a pass mode that relays data between the ports. Significantly, each device contains configurable switching elements that allow a test mode, wherein unidirectional input/output data on one SBD data port is mapped to bi-directional data on the other SBD data port. This allows device testing with automated test equipment that employs unidirectional data signaling, and yet allows such test equipment to test the SBD capability of such devices.