US Patent 7129733 Dynamic overdrive compensation test system and method

Patent 7129733 was granted and assigned to Intel on October, 2006 by the United States Patent and Trademark Office.

Overview Structured Data Issues Contributors Activity

Is a

Patent

Patent attributes

Current Assignee

Intel

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

71297330

Patent Inventor Names

Mike R. Moran0

Uday R. Savagaonkar0

Date of Patent

October 31, 2006

Patent Application Number

107267470

Date Filed

December 2, 2003

Patent Primary Examiner

‌

Jermele Hollington

Patent abstract

The invention(s) relates to a wafer test system including a circuit to communicate an overdrive to a chuck, the chuck moving a wafer towards a probe head responsive to the overdrive, a circuit to measure a contact resistance of at least one channel in each of a plurality of dies associated with the wafer using the probe head, a circuit to compute a per channel standard deviation responsive to measuring the contact resistance, a circuit to compare the standard deviation on the at least one channel to a threshold, and a circuit to increase the overdrive responsive to the comparison.