Patent attributes
Above a measuring object (2), an LEDs (4) for use in light irradiation and a CMOS area sensor (8) with an image-forming lens (6) interpolated in between are installed. In order to detect the quantity of light from the LEDs (4), a photodetector (10) is further placed. A personal computer (28) carries out a linearizing process which, upon variation of the quantity of light, corrects the output of the area sensor (8) so as to make the output from the area sensor (8) proportional to the output of the photodetector (10), and a light-irregularity correction process which, when a flat plate having even in-plane density is measured as the measuring object (2), corrects the resulting output of each pixel in the area sensor (8) that has been corrected by the linearizing process to have in-plane evenness. It becomes possible to achieve a convenient two-dimensional reflection factor measuring method which does not need any mechanical driving system.
