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US Patent 7106459 CD metrology analysis using a finite difference method

Patent 7106459 was granted and assigned to Therma-Wave on September, 2006 by the United States Patent and Trademark Office.

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Patent
Patent

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Current Assignee
Therma-Wave
Therma-Wave
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7106459
Date of Patent
September 12, 2006
Patent Application Number
11150003
Date Filed
June 10, 2005
Patent Primary Examiner
‌
Richard A. Rosenberger
Patent abstract

A method for modeling diffraction includes constructing a theoretical model of the subject. A numerical method is then used to predict the output field that is created when an incident field is diffracted by the subject. The numerical method begins by computing the output field at the upper boundary of the substrate and then iterates upward through each of the subject's layers. Structurally simple layers are evaluated directly. More complex layers are discretized into slices. A finite difference scheme is performed for these layers using a recursive expansion of the field-current ratio that starts (or has a base case) at the lowermost slice. The combined evaluation, through all layers, creates a scattering matrix that is evaluated to determine the output field for the subject.

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