US Patent 7093490 Ultrasonic flaw detecting method and ultrasonic flaw detector

Patent 7093490 was granted and assigned to Hitachi on August, 2006 by the United States Patent and Trademark Office.

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Is a

Patent

Patent attributes

Current Assignee

Hitachi

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

7093490

Patent Inventor Names

Naoyuki Kono0

Masahiro Tooma0

Yoshinori Musha0

Tetsuya Matsui0

Masahiro Koike0

Masahiro Miki0

Date of Patent

August 22, 2006

Patent Application Number

11049949

Date Filed

February 4, 2005

Patent Primary Examiner

Hezron Williams

Patent abstract

In order to make it possible in ultrasonic flaw detection to generate ultrasonic waves containing a main beam only by use of an array probe and clearly identify a defect in a specimen by use of images, an element pitch P (the distance between centers of adjacent ultrasonic transducer elements in the array probe) is set longer than ¼ of the wavelength of longitudinal waves generated by the ultrasonic transducer elements and shorter than ½ of the wavelength and reception signals up to time corresponding to the sum of wall thickness round-trip propagation time for longitudinal waves and wall thickness round-trip propagation time for shear waves in the specimen are displayed.