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US Patent 7057737 Common optical-path testing of high-numerical-aperture wavefronts

Patent 7057737 was granted and assigned to 4D Technology Corporation on June, 2006 by the United States Patent and Trademark Office.

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Current Assignee
4D Technology Corporation
4D Technology Corporation
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
70577370
Patent Inventor Names
James E. Millerd0
James C. Wyant0
John B. Hayes0
Neal J. Brock0
Date of Patent
June 6, 2006
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Patent Application Number
106529030
Date Filed
August 29, 2003
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Patent Citations Received
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US Patent 12000698 Polarization-separated, phase-shifted interferometer
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US Patent 12104897 Interometric optical system
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Patent Primary Examiner
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Samuel A. Turner
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Patent abstract

A polarizing point-diffraction plate is used to produce common-path test and reference wavefronts with mutually orthogonal polarizations from an input wavefront. The common-path test and reference wavefronts are collimated, phase shifted and interfered, and the resulting interferograms are imaged on a detector. The interference patterns are then processed using conventional algorithms to characterize the input light wavefront.

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