US Patent 6979570 Particle analyzer and particle analyzing method

A particle analyzer includes a detecting section for detecting respective characteristic parameters of a plurality of particles, a distribution map preparing section for preparing at least two kinds of two-dimensional frequency distribution maps of the particles by using the detected characteristic parameters, a classifying section for classifying the particles into particle clusters on the two kinds of distribution maps, a calculating section for calculating and comparing the respective numbers of particles in the particle clusters containing particles of common kind to the two kinds of distribution maps, and a judging section for judging a classification error on the distribution maps based on a comparison result.