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US Patent 6947521 Imaging method based on attenuation, refraction and ultra-small-angle-scattering of x-rays

Patent 6947521 was granted and assigned to Illinois Institute of Technology on September, 2005 by the United States Patent and Trademark Office.

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Is a
Patent
Patent
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Patent attributes

Patent Applicant
0
Current Assignee
Illinois Institute of Technology
Illinois Institute of Technology
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
69475210
Patent Inventor Names
Leroy Dean Chapman0
Miles N. Wernick0
Oral Oltulu0
Zhong Zhong0
Date of Patent
September 20, 2005
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Patent Application Number
104638270
Date Filed
June 17, 2003
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Patent Citations Received
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US Patent 12007341 X-ray baggage and parcel inspection system with efficient third-party image processing
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Patent Primary Examiner
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Allen C. Ho
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Patent abstract

A method for detecting an image of an object by measuring the intensity at a plurality of positions of a transmitted beam of x-ray radiation emitted from the object as a function of angle within the transmitted beam. The intensity measurements of the transmitted beam are obtained by a crystal analyzer positioned at a plurality of angular positions. The plurality of intensity measurements are used to determine the angular intensity spectrum of the transmitted beam. One or more parameters, such as an attenuation property, a refraction property and a scatter property, can be obtained from the angular intensity spectrum and used to display an image of the object.

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