US Patent 6840374 Apparatus and method for cleaning test probes
Patent 6840374 was granted and assigned to LG on January, 2005 by the United States Patent and Trademark Office.
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Patent abstract
A probe cleaning apparatus for cleaning a probe tip use to test semiconductors dies having an abrasive substrate layer an a tacky gel layer on top of the abrasive surface of the abrasive substrate layer. The probe tip is cleaned by passing it through the tacky gel layer so that it comes in contact with the abrasive surface of the abrasive substrate, moving the probe tip across the abrasive surface of the substrate layer, and then removing the probe tip from the successive layers of the cleaning apparatus. The probe tip emerges from the cleaning apparatus free from debris associated with testing the semiconductor dies.
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Patent Inventor Names
Benjamin N. Eldridge0
Christopher C. Buckholtz0
Gaetan L. Mathieu0
Gary W. Grube0
Igor Y. Khandros0
Michael A. Drush0
Treliant Fang0
Date of Patent
January 11, 2005
0Patent Application Number
100509080
Date Filed
January 18, 2002
0Patent Primary Examiner
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US Patent 6840374 Apparatus and method for cleaning test probes
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