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US Patent 12128523 Polishing apparatus

Patent 12128523 was granted and assigned to Ebara Corporation on October, 2024 by the United States Patent and Trademark Office.

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Is a
Patent
Patent
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Patent attributes

Patent Applicant
Ebara Corporation
Ebara Corporation
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Current Assignee
Ebara Corporation
Ebara Corporation
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
121285230
Patent Inventor Names
Makoto Fukushima0
Keisuke Namiki0
Hozumi Yasuda0
Satoru Yamaki0
Shingo Togashi0
Osamu Nabeya0
Date of Patent
October 29, 2024
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Patent Application Number
168908330
Date Filed
June 2, 2020
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Patent Citations
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US Patent 9855638 Dressing apparatus, polishing apparatus having the dressing apparatus, and polishing method
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US Patent 8740673 CMP retaining ring with soft retaining ring insert
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US Patent 6857950 Polishing apparatus, semiconductor device manufacturing method using the polishing apparatus, and semiconductor device manufactured by the manufacturing method
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US Patent 6932671 Method for controlling a chemical mechanical polishing (CMP) operation
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US Patent 6976903 Apparatus for controlling retaining ring and wafer head tilt for chemical mechanical polishing
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US Patent 7101272 Carrier head for thermal drift compensation
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US Patent 7238083 Wafer carrier with pressurized membrane and retaining ring actuator
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Patent Primary Examiner
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Brian D Keller
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CPC Code
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B24B 49/16
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B24B 37/345
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B24B 37/105
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B24B 37/32
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B24B 37/30
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B24B 7/228
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B24B 47/20
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Patent abstract

A polishing apparatus polishes a substrate by bringing the substrate into sliding contact with a polishing surface. The polishing apparatus includes: a substrate holder having a substrate holding surface for pressing the substrate against the polishing surface and further having a retaining ring arranged so as to surround the substrate and brought into contact with the polishing surface, the retaining ring being configured to be tiltable independently of the substrate holding surface; a rotating mechanism configured to rotate the substrate holder about its own axis; and at least one local load exerting mechanism configured to exert a local load on a part of the retaining ring in a direction perpendicular to the polishing surface. The at least one local load exerting mechanism is arranged so as not to rotate together with the substrate holder.

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