US Patent 12112468 Method and apparatus for detecting dimension error
Patent 12112468 was granted and assigned to Electronics and Telecommunications Research Institute on October, 2024 by the United States Patent and Trademark Office.
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US Patent 12112468 Method and apparatus for detecting dimension error
Article
Patent abstract
An apparatus for detecting a dimension error obtains an image of a target object, estimates dimensional data for a region of interest (ROI) for which dimensions are to be measured from the image of the target object using a learned dimensional measurement model, and determines whether there is a dimension error in the ROI from the estimated dimension data using a learned dimension error determination model.
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Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Hye-Jin Kim0
Suyoung Chi0
Date of Patent
October 8, 2024
0Patent Application Number
171630510
Date Filed
January 29, 2021
0Patent Citations
Patent Primary Examiner
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