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US Patent 12111755 Generating test data for application performance

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
0
Date Filed
January 31, 2022
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Date of Patent
October 8, 2024
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Patent Application Number
17649535
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Patent Citations
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US Patent 10339038 Method and system for generating production data pattern driven test data
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US Patent 10474559 System for distributed software quality improvement
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US Patent 6961925 Parallelism performance analysis based on execution trace information
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US Patent 10467220 System and method for generating an effective test data set for testing big data applications
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Patent Inventor Names
Siba Prasad Satapathy
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Anna Tatunashvili
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Jozef Fekia{hacek over (c)}
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George Thayyil Jacob Sushil
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Rupam Bhattacharjee
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
12111755
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Patent Primary Examiner
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Geoffrey R St Leger
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CPC Code
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G06F 11/3692
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G06F 11/3688
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G06F 11/3684
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