US Patent 12106197 Learning parameter sampling configuration for automated machine learning

Mechanisms are provided for performing an automated machine learning (AutoML) operation to configure parameters of a machine learning model. AutoML logic is configured based on an initial parameter sampling configuration for sampling values of parameter(s) of the machine learning (ML) model. An initial AutoML process is executed on the ML model based on a dataset utilizing the initially configured AutoML logic, to generate at least one learned value for the parameter(s) of the ML model. The dataset is analyzed to extract a set of dataset characteristics that define properties of a format and/or a content of the dataset which are stored in association with the at least one learned value as part of a training dataset. A ML prediction model is trained based on the training dataset to predict, for new datasets, corresponding new sampling configuration information based on characteristics of the new datasets.