US Patent 12092519 All-optical light field sampling with attosecond resolution

System and method configured for real-time, direct, all-optical methodology of measurement of a temporal profile of optical field. In one case, such measurement is carried out by recording electronic delay response of a target material system triggered by a strong driving optical field (in particular—by pulsed light with sub-femtosecond pulses containing a few cycles of optical field each). A corresponding all-optical metrological tool configured to operate with (sub-)femtosecond resolution. Demonstration of the on-demand sub-femtosecond electron motion control in solid-state with the use of synthesized waveforms of optical field.