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US Patent 12061227 Integrated heater and temperature measurement

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
September 20, 2023
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Date of Patent
August 13, 2024
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Patent Application Number
18471192
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Patent Citations
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US Patent 11493551 Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
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US Patent 11039528 Assembly and sub-assembly for thermal control of electronic devices
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US Patent 11340283 Testing device
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US Patent 11567119 Testing system including active thermal interposer device
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US Patent 11656272 Test system with a thermal head comprising a plurality of adapters and one or more cold plates for independent control of zones
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US Patent 11674999 Wafer scale active thermal interposer for device testing
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US Patent 11693051 Thermal head for independent control of zones
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US Patent 11835549 Thermal array with gimbal features and enhanced thermal performance
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US Patent 11852678 Multi-input multi-zone thermal control for device testing
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US Patent 6862405 Apparatus, method and system of liquid-based, wide range, fast response temperature control of electric devices
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•••
Patent Inventor Names
Terry Sinclair Connacher
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Carl L. Ostrowski
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
12061227
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Patent Primary Examiner
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Tung X Nguyen
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CPC Code
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G01R 31/2875
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G01R 31/2877
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G01R 31/2874
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